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FilmMaker

Overview

FilmMaker2.1 is supplied with every Intellemetrics optical monitoring system. It comes pre-installed on every Intellemetrics Optical Monitor, but more importantly it can also be installed on your design PCs. It allows customers to do the following general tasks;

  • Create a filmstack design from scratch or read one in from a 3rd party design package (e.g. TFCalc, Macleod, Optilayer, Filmstar, etc).
  • Model the filmstack design.
  • Create an optical monitoring scheme from the filmstack design including substrate materials, dispersion, test glass changes, monitoring configuration, etc.
  • Use a range of tools to analyse the performance of the optical monitoring scheme in a real-life coating process before committing to doing an actual coating run.
  • Analyse the data from previous coating runs to help optimise future coating runs.
  • Output a Project file containg all of the information to perform an automated coating run.

Features

The main new features of FilmMaker2.1 include;
  • Full incorporation of substrate dispersion into all modelling engines.
  • Full incorporation of test glass changes into FilmEditor and FilmSimulator.
  • Tooling factors and deposition rates incorporated into materials databases.
  • Automatic optimisation of QWFactors on a layer-by-layer basis with further automatic fine tuning on a complete filmstack basis.
  • Automatic calculation of SamplesPerQW, Holdoff, Latency, ForceCutTime.
  • Resultant film characteristics shown on the test glass or on the product.
  • Streamlined FilmEditor and FilmSimulator for faster, interactive design of optical monitoring schemes with instant visual feedback.
  • Streamlined project creation, saving and transferring to FilmDirector.
  • Runs on Windows7, 8 and 10, both 32bit and 64bit.
  • Backward compatibility with Projects created in previous FilmMaker versions.

Standard FilmMaker Features

  • Range of tools to rapidly design and model quarter wave and non-quarter wave designs.
  • Unlimited number of materials.
  • Handles absorbing and non-absorbing materials.
  • Monitoring configurations include front face reflection, back face reflection and transmission mode.
  • Automatic optimisation of gain levels.
  • Wavelength range from 190nm to 30,000nm.
  • Material databases for unlimited number of n, k values. Select between Private or Public Materials Databases.
  • Handles direct monitoring on coated products or in-direct monitoring on an unlimited number of test glasses.
  • Substrates can be double side polished, single side polished / back side roughened and/or AR coated.
  • Automated insertion of forced cut time safety margins.
  • Unlimited number of layers.
  • Materials, layers and other data can be imported from various sources and exported to CVS and/or Excel.
  • Associates a deposition rate and tooling factor with each material.
  • Models Signal Level (T or R %) vs thickness.
  • Ability to cut individual layers based on optical monitor, crystal controller, time or manually.

FilmEditor Features Include:

  • Optimisation of wavelength on a layer by layer basis.
  • Minimisation of cut point errors on a layer by layer basis by automatic optimisation of QWFactors.
  • Change test glasses and see the effects.
  • Wide range of analysis modes and filtering schemes.
  • Instant visual feedback on all of the above for fast intuitive process design.

FilmSimulator Features Include:

  • Plot spectral characteristics from 190nm to 30,000nm.
  • Visualisation of spectral characteristics of filmstack on the test glass or on the coated product.
  • Further automatic optimisation of QWFactors on a complete filmstack basis.
  • Definition of error sources for your particular chamber, optical monitor, monitoring configuration including optical noise, photometric gain error, photometric offset error, wavelength setpoint error, and instrument bandwidth.
  • Simulation of unlimited number of spectral characteristics taking errors and impact on subsequent layer cuts into account.
  • Investigate yield and performance of your design before doing a coating run.
  • Plot cut errors on a layer by layer basis for unlimited number of runs. Investigate process robustness.
  • Export errors for analysis in third party software.

FilmReviewer Features Include;

  • Review run data from previous coating runs.
  • Load single or multiple layers for analysis.
  • View optical monitor parameters used for that layer.
  • Change parameters and reprocess the data and see the effects. Ideal tool for optimisation of parameters using real run data from your system.

Screenshots

Click on the images below to view the screenshot.

The main FilmMaker data entry area. The Material Database Form The main FilmMaker menu bar Select colours for each layer. These colours are carried through to all graphs and even into FilmDirector. Many of the important parameters can be set in the Ribbon Bar. Example model output for a FAR-IR filmstack monitored in a non-quarter wave mode. Example model output for a visible narrow band filter An example FilmEditor screen showing the modelled waveform and the processed waveform for layer 6 of a multilayer stack. An example of the FilmSimulator screen. Graphs can be zoomed in a number of different ways, copied to the clipboard, saved as BMP files, and many can be saved to CSV files for analysis in third party software. The FilmReviewer screen